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Wim van der Hoek Award…

Winner of the Wim van der Hoek Award 2015 is Gihin Mok with his Master Thesis ‘The design of a planar precision stage using cost effective optical mouse sensors’:  ...

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Agile systems engineering approach towards…

In the semiconductor industry, Moore’s law comes with increasing and complex demands and the need for advanced process control metrology. Nearfield Instruments fulfils these needs with their high-throughput scanning probe...

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Mikroniek September 2015: focus on…

The forthcoming September issue of Mikroniek, click here for a preview, is in part dedicated to the first DSPE Optics and Optomechatronics Week (28 September – 2 October 2015). Naturally,...

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